HZDZ2643 Insulation Material Volume Surface Resistivity Tester
Instructions
HZDZ2643 Ultra-high Resistance Micro-current Tester(Tester for Surface Resistivity of Volume Resistivity of Insulating Material and Electrostatic Conducting Material)is a multi-purpose comprehensive measuring device developed in accordance with national standards of China:GB/T 1410－2006/IEC 60093:1980：《Methods of test for volume resistivity and surface resistivity of solid electrical insulating materials》. It can also be used as an ultra-high resistance meter or a micro-current tester.
This tester is specially equipped with the function of double-window synchronous display of test results (resistivity or surface resistance) and test conditions (voltage or current).
It is composed of HZDZ2643 high resistance tester host machine,standard annular three-electrode, connecting cable and so on. The host machine is mainly composed of high voltage power supply, micro-current detector and embedded MCU system.
Digital keyboard input is used for all parameter setting and function conversion of the instrument. The instrument can automatically/manually change the range, and the test results are displayed directly by the digital header. The instrument has the characteristics of high measurement accuracy, high sensitivity, good stability, high intelligence, compact structure, simple measurement and convenient reading.
The instrument is suitable for testing the resistance values of anti-static products such as anti-static shoes, anti-static plastic rubber products, anti-static movable floor of computer room and measuring the insulation resistance of insulating materials and electronic and electrical products in industrial and mining enterprises and scientific research institutes. It can also be used for weak current measurement such as photoelectric effect and device dark current measurement.
Technical parameter
1. Measurement Range and Resolution
Test Voltage Range UX: 0.1V ～100V.
Resistance test range RX: 1×102Ω ～5×1013Ω, Resolution 1/2000,
Current test range IX: 1.5× 10-3A ～ 10× 10-12A, Resolution 1/2000.
Resistance：1.0×102 ～ 2.0×1014 Ω, resolution 0.01×102 ～ 0.01×1014 Ω
Resistivity：Kv×(1.0×102 ～ 2.0×1014 )Ω-cm, resolution 0.01×103 ～ 0.01×1014 Ω-cm, K=1～1000.
Square Resistance：K□×(1.0×102 ～ 2.0×1014 )Ω/□,resolution 0.01×103 ～ 0.01×1014 Ω/□,K□=34.5.
2. Range Division and accuracy degree
|
Number |
Range |
Effective measurement range |
Test voltage |
Test current |
error |
|
1 |
103Ω-cm/□ |
0.100～1.000 |
1.00V |
1.000～0.100 mA |
±5% FSB |
|
2 |
103Ω-cm/□ |
01.00～10.00 |
10.0V |
1.000～0.100 mA |
±3% FSB |
|
3 |
103Ω-cm/□ |
010.0～450.0 |
100V |
1.000～0.100 mA |
|
|
4 |
106Ω-cm/□ |
0.450～4.500 |
500V |
1.000～0.100 mA |
|
|
5 |
106Ω-cm/□ |
04.50～50.00 |
500V |
100.0～010.0μA |
±5% FSB |
|
6 |
106Ω-cm/□ |
050.0～500.0 |
500V |
10.00～1.00μA |
|
|
7 |
109Ω-cm/□ |
0.500～5.000 |
500V |
1.000～0.100μA |
|
|
8 |
109Ω-cm/□ |
05.00～50.00 |
500V |
100.0～010.0 nA |
±8%FSB |
|
9 |
109Ω-cm/□ |
050.0～500.0 |
500V |
10.00～01.00 nA |
|
|
10 |
1012Ω-cm/□ |
0.500～5.000 |
500V |
1.000～0.100 nA |
|
|
11 |
1012Ω-cm/□ |
05.00～50.00 |
500V |
100.0～010.0 pA |
±10%FSB |
3. Measurable Dimensions of Semiconductor Materials
Diameter： ≥90mm(length)×90mm(width),or Φ≥90mm
Thickness： thickness d≤2.5mm,
4. Power Supply：
Power ：< 15W
Input: 220V±10% 50Hz
5. Working conditions：
Temperature ： 0～35℃
Relative humidity： ≥60%
No strong electromagnetic interference,Not sharing power with high frequency equipment.
6. Outline size：
Main engine： W×H×L=32cm×13cm×32cm
High Voltage Test Bench： Φ=100mm(Base diameter)×80 mm(height)