HZDZ2643 Ultra-high Resistance Micro-current Tester
I. Instructions
The HZDZ2643 Ultra-high Resistance Micro-current Tester (Tester for Surface Resistivity and Volume Resistivity of Insulating Materials and Electrostatic Conducting Materials) is a multi-purpose comprehensive measuring device developed in accordance with the Chinese national standard GB/T 1410-2006 / IEC 60093:1980 Methods of Test for Volume Resistivity and Surface Resistivity of Solid Electrical Insulating Materials. It can also be used as an ultra-high resistance meter or a micro-current tester.
This tester is specially equipped with a dual-window synchronous display function, showing test results (resistivity or surface resistance) and test conditions (voltage or current) simultaneously.
The system consists of the HZDZ2643 high resistance tester host machine, a standard annular three-electrode, connecting cables, and other accessories. The host machine is primarily composed of a high-voltage power supply, a micro-current detector, and an embedded MCU system.
Digital keyboard input is used for all parameter setting and function conversion. The instrument can automatically or manually change ranges, and test results are displayed directly on the digital header. It features high measurement accuracy, high sensitivity, good stability, high intelligence, compact structure, simple measurement, and convenient reading.
The instrument is suitable for testing the resistance values of anti-static products-such as anti-static shoes, anti-static plastic and rubber products, and anti-static movable floors for computer rooms-as well as measuring the insulation resistance of insulating materials and electronic and electrical products in industrial and mining enterprises and scientific research institutes. It can also be used for weak current measurement, such as photoelectric effect and device dark current measurement.
II. Technical Parameters
1. Measurement Range and Resolution
Test Voltage Range UX: 0.1V ～100V.
Resistance test range RX: 1×102Ω ～5×1013Ω, Resolution 1/2000,
Current test range IX: 1.5× 10-3A ～ 10× 10-12A, Resolution 1/2000.
Resistance：1.0×102 ～ 2.0×1014 Ω, resolution 0.01×102 ～ 0.01×1014 Ω
Resistivity：Kv×(1.0×102 ～ 2.0×1014 )Ω-cm, resolution 0.01×103 ～ 0.01×1014 Ω-cm, K=1～1000.
Square Resistance：K□×(1.0×102 ～ 2.0×1014 )Ω/□,resolution 0.01×103 ～ 0.01×1014 Ω/□,K□=34.5.
2. Range Division and accuracy degree
|
Number |
Range |
Effective measurement range |
Test voltage |
Test current |
error |
|
1 |
103Ω-cm/□ |
0.100～1.000 |
1.00V |
1.000～0.100 mA |
±5% FSB |
|
2 |
103Ω-cm/□ |
01.00～10.00 |
10.0V |
1.000～0.100 mA |
±3% FSB |
|
3 |
103Ω-cm/□ |
010.0～450.0 |
100V |
1.000～0.100 mA |
|
|
4 |
106Ω-cm/□ |
0.450～4.500 |
500V |
1.000～0.100 mA |
|
|
5 |
106Ω-cm/□ |
04.50～50.00 |
500V |
100.0～010.0μA |
±5% FSB |
|
6 |
106Ω-cm/□ |
050.0～500.0 |
500V |
10.00～1.00μA |
|
|
7 |
109Ω-cm/□ |
0.500～5.000 |
500V |
1.000～0.100μA |
|
|
8 |
109Ω-cm/□ |
05.00～50.00 |
500V |
100.0～010.0 nA |
±8%FSB |
|
9 |
109Ω-cm/□ |
050.0～500.0 |
500V |
10.00～01.00 nA |
|
|
10 |
1012Ω-cm/□ |
0.500～5.000 |
500V |
1.000～0.100 nA |
|
|
11 |
1012Ω-cm/□ |
05.00～50.00 |
500V |
100.0～010.0 pA |
±10%FSB |
3. Measurable Dimensions of Semiconductor Materials
Diameter: ≥90 mm (length) × 90 mm (width), or Φ ≥ 90 mm
Thickness: d ≤ 2.5 mm
4. Power Supply
Power: < 15 W
Input: 220 V ± 10%, 50 Hz
5. Working Conditions
Temperature: 0–35 °C
Relative Humidity: ≥ 60%
No strong electromagnetic interference; not sharing power with high-frequency equipment
6. Outline Dimensions
Main Engine: W × H × L = 32 cm × 13 cm × 32 cm
High Voltage Test Bench: Φ = 100 mm (base diameter) × 80 mm (height)